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A position-sensitive detector system for the measurement of diffuse X-ray scattering

1990; Wiley; Volume: 23; Issue: 6 Linguagem: Inglês

10.1107/s002188989000646x

1600-5767

J.C. Osborn, T. R. Welberry,

X-ray Diffraction in Crystallography

The use of a one-dimensional position-sensitive detector for diffuse X-ray scattering measurements is described. Calibration procedures for scattering angle and intensity measurements are discussed. Some nonuniformities have been found in the counting efficiency as a function of distance along the detector. A procedure is described for measuring the diffuse scattering in a section of reciprocal space.