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Atomic Crack Tips in Silicon Carbide and Silicon Crystals

1990; Wiley; Volume: 73; Issue: 3 Linguagem: Inglês

10.1111/j.1151-2916.1990.tb06589.x

1551-2916

Hidehiko Tanaka, Yoshio Bando,

Semiconductor materials and devices

Journal of the American Ceramic SocietyVolume 73, Issue 3 p. 761-763 Atomic Crack Tips in Silicon Carbide and Silicon Crystals Hidehiko Tanaka, Hidehiko Tanaka National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba-shi, Ibaraki-ken 305, Japan Member, American Ceramic Society.Search for more papers by this authorYoshio Bando, Yoshio Bando National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba-shi, Ibaraki-ken 305, JapanSearch for more papers by this author Hidehiko Tanaka, Hidehiko Tanaka National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba-shi, Ibaraki-ken 305, Japan Member, American Ceramic Society.Search for more papers by this authorYoshio Bando, Yoshio Bando National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba-shi, Ibaraki-ken 305, JapanSearch for more papers by this author First published: March 1990 https://doi.org/10.1111/j.1151-2916.1990.tb06589.xCitations: 12 Presented at the Annual Meeting of the Ceramic Society of Japan, Tokyo, Japan, May 27, 1988, and the Fall Meeting of the Ceramic Society of Japan, Nagaoka, Japan, September 29, 1988. B. Lawn—contributing editor AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat No abstract is available for this article. References 1 S. M. Wiederhorn, B. J. Hockey, and D. E. Roberts, “Effect of Temperature on the Fracture of Sapphire,” Philos. Mag., 29, 783–96 (1973). 2 B. J. Hockey and B. R. Lawn, “Electron Microscopy of Microcracking about Indentations in Aluminum Oxide and Silicon Carbide,” J. Mater. Sci., 10, 1275–84 (1975). 3 B. R. Lawn, B. J. Hockey, and S. M. Widerhorn, “Atomically Sharp Cracks in Brittle Solids: An Electron Microscopy Study,” J. Mater. Sci., 15, 1207–23 (1980). 4 H. Tanaka, Y. Bando, Y. Inomata, and M. Mitomo “Atomically Sharp Crack in 15R-Sialon,” J. Am. Ceram. Soc., 71 [1] C-32–C-33 (1988). 5 K. Maeda, “Dislocation Glide Induced Plasticity of 6H SiC singel Crystals,” J. Ceram. Soc. Jpn., 94 [8] 784–89 (1986). 6 K. Maeda, K. Suzuki, S. Fujita, M. Ichihara, and S. Hyodo, “Defects in Plastically Deformed 6H SiC Single Crystals Studied by Transmission Electron Microscopy,” Philos Mag. A, 57 [4] 573–92 (1988). 7 D. R. Clarke, M. C. Kroll, P. D. Kirchner, R. F. Cook, and B. J. Hockey, “Amorphization and Conductivity of Silicon and Germanium Induced by Indentation,” Phys. Rev. Lett., 60 [21] 3154–60 (1988). 8 R. Thomson, C. Hsieh, and V. Rana, “Lattice Trapping of Fracture Cracks,” J. Appl. Phys., 42 [8] 3154–60 (1971). 9 C. Hsieh and R. Thomson, “Lattice Theory of Fracture and Crack Creep,” J. Appl. Phys., 44 [5] 2051–63 (1973). 10 J. E. Sinclair and B. R. Lawn, “An Atomistic Study of Cracks in Diamond-Structure Crystals,” Proc. R. Soc. London, A, 329, 83–103 (1972). 11 J. E. Sinclair, “The Influence of the Interatomic Force Law and of Kinks on the Propagation of Brittle Cracks,” Philos. Mag., 31, 647–71 (1975). Citing Literature Volume73, Issue3March 1990Pages 761-763 ReferencesRelatedInformation