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Dielectric breakdown of Ag2S in the Au-Ag2S-Ag system

1976; American Institute of Physics; Volume: 47; Issue: 5 Linguagem: Inglês

10.1063/1.322896

1520-8850

Sandeep Sharma, J. H. Thomas,

Theoretical and Computational Physics

Electrical breakdown of tarnish films (Ag2S) on silver has been investigated in the Au-Ag2S-Ag system. Dielectric breakdown in the Au-Ag2S-Ag system is polarity sensitive and depends on the rate of application of voltage to the film. Breakdown is consistent with multiple electron avalanche processes. Data indicate intrinsic breakdown fields greater than 3×105 V/cm (for fast rise time voltages). For slow rise time voltages, breakdown is strongly affected by silver ion mobility and becomes polarity dependent. The conductivity ratio (σAgrich/σSrich) has been obtained as a function of time and the average Ag ion mobility (2×10−8 cm2/V sec) has been determined.