Deformation-Free Topography from Combined Scanning Force and Tunnelling Experiments
1993; Institute of Physics; Volume: 23; Issue: 6 Linguagem: Inglês
10.1209/0295-5075/23/6/007
ISSN1286-4854
AutoresDario Anselmetti, Ch. Gerber, Bruno Michel, Heiko Wolf, H.‐J. Güntherodt, H. Rohrer,
Tópico(s)Surface and Thin Film Phenomena
ResumoWe show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.
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