Erratum to: “A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF” [Nucl. Instr. and Meth. B 149 (1999) 213]
1999; Elsevier BV; Volume: 159; Issue: 1-2 Linguagem: Inglês
10.1016/s0168-583x(99)00536-4
ISSN1872-9584
AutoresR. Baudoing-Savois, G. Renaud, M. De Santis, A. Barbier, O. Robach, P. Taunier, P. Jeantet, O. Ulrich, Jean‐Paul Roux, Marie-Claire Saint-Lager, A. Barski, Olivier Geaymond, Georges Bérard, P. Dolle, M. Noblet, A. Mougin,
Tópico(s)X-ray Spectroscopy and Fluorescence Analysis
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