An initiation mechanism of thermal instability of a metal-diamond-vacuum field emission regime
1999; American Institute of Physics; Volume: 75; Issue: 16 Linguagem: Inglês
10.1063/1.125121
ISSN1520-8842
AutoresNing Xu, Zhiqiang Yu, Shaozhi Deng, Jun Chen, Sheng Wu,
Tópico(s)Vacuum and Plasma Arcs
ResumoAn analysis is carried out of the physical origin of thermal instability that can trigger a catastrophic vacuum breakdown event in vacuum microelectronic devices based on flat diamond emitters. The temperature rise in a diamond film will enhance internal field emission across metal–diamond interface. This effect can lead to a regenerative process that can initiate a breakdown event at temperature lower than the melting point of an emitter. A set of equations has been developed. These theoretical findings are successfully applied to explain the instability of field emission from the nondoped diamond films.
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