Artigo Revisado por pares

An initiation mechanism of thermal instability of a metal-diamond-vacuum field emission regime

1999; American Institute of Physics; Volume: 75; Issue: 16 Linguagem: Inglês

10.1063/1.125121

ISSN

1520-8842

Autores

Ning Xu, Zhiqiang Yu, Shaozhi Deng, Jun Chen, Sheng Wu,

Tópico(s)

Vacuum and Plasma Arcs

Resumo

An analysis is carried out of the physical origin of thermal instability that can trigger a catastrophic vacuum breakdown event in vacuum microelectronic devices based on flat diamond emitters. The temperature rise in a diamond film will enhance internal field emission across metal–diamond interface. This effect can lead to a regenerative process that can initiate a breakdown event at temperature lower than the melting point of an emitter. A set of equations has been developed. These theoretical findings are successfully applied to explain the instability of field emission from the nondoped diamond films.

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