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Double-tip scanning tunneling microscope for surface analysis

1995; American Physical Society; Volume: 51; Issue: 8 Linguagem: Inglês

10.1103/physrevb.51.5502

1095-3795

Q. Niu, Ming-Che Chang, Chih‐Kang Shih,

Molecular Junctions and Nanostructures

We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.