Use of microwave plasma torch atomic emission spectrometry for the determination of silicon
1997; Springer Science+Business Media; Volume: 357; Issue: 4 Linguagem: Inglês
10.1007/s002160050174
ISSN1432-1130
AutoresFeng Liang, Hanqi Zhang, Qun Jin, Zhang Da-xin, Yahu Lei, Qinhan Jin,
Tópico(s)Mass Spectrometry Techniques and Applications
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