Time-resolved study of laser-induced breakdown in dielectrics
2001; Institute of Physics; Volume: 56; Issue: 1 Linguagem: Inglês
10.1209/epl/i2001-00499-9
ISSN1286-4854
AutoresF. Quéré, S. Guizard, Ph. Martin,
Tópico(s)Ocular and Laser Science Research
ResumoWe present the first femtosecond time-resolved study of the evolution of the laser-excited carrier density with the laser intensity, in various dielectrics of practical interest (SiO2, Al2O3, MgO) both above and below the breakdown threshold. These measurements demonstrate that the high electronic excitation responsible for optical breakdown in these solids is produced by multiphoton absorption by valence electrons, for pulses shorter than a few ps. No sign of electronic avalanche has been observed for such short pulses.
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