Portal de Periódicos da CAPES

TEM investigation of halide CVD grown Bi2Sr2CaCu2O8 + x films

1997; Elsevier BV; Volume: 251; Issue: 1-2 Linguagem: Inglês

10.1016/s0925-8388(96)02786-7

1873-4669

Anders Hårsta, Jun Lu,

Iron-based superconductors research

The superconducting Bi2Sr2CaCu2O8+x (Bi-2212) phase has been deposited by halide CVD on two different substrate materials, MgO(001) and SrTiO3(001). Metal iodides and oxygen were used as precursors. The films grew with a strong [001] orientation and only the 00l reflections with l=2n were observed. The in-plane orientational relationships were determined by TEM to be [100]MgO//[100]Bi-2212 and [100]MgO//[110]Bi-2212 for the MgO(001) substrate and [100]SrTiO3//[110]Bi-2212 for the SrTiO3(001) substrate. The interfacial regions of the two substrate materials were investigated by cross sectional HREM, revealing that the interface is nearly atomically abrupt for both substrate materials. The first atomic layer of the films were found to be a BiO layer.