Atom probe analysis and modelling of interfaces in magnetic multilayers
1992; Elsevier BV; Volume: 47; Issue: 4 Linguagem: Inglês
10.1016/0304-3991(92)90167-i
ISSN1879-2723
AutoresA. K. Petford‐Long, Alfred Cerezo, J.M. Hyde,
Tópico(s)Microstructure and mechanical properties
ResumoThe nature of the interfaces in metallic multilayer films (MLF) has a profound effect on their magnetic properties. We have used atom probe microanalysis and Monte Carlo modelling to follow changes in interface profile during annealing in Co/Ni and Fe/Cr layered films. The aim is to understand the interface kinetics, and thus to tailor specimen processing to produce the optimum interfaces for each magnetic application. Experimental results showed that annealing for 1 h at 300°C extended the interfacial mixing in Co/Ni films from two atomic layers to 1 nm. Modelling of ageing in Co/Ni films showed a similar increase in interfacial thickness, whilst modelling of ageing in Fe/Cr films increased the interface sharpness by an “interface spinodal” reaction.
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