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Use of atomic force microscopy in particle science and technology research

1998; Elsevier BV; Volume: 133; Issue: 1-2 Linguagem: Inglês

10.1016/s0927-7757(97)00127-1

1873-4359

M.R. Yalamanchili, S. Veeramasuneni, Maria Augusta D Azevedo, Jan D. Miller,

Near-Field Optical Microscopy

The atomic force microscopy, because of its unique features, can be used for a variety of applications and provides excellent research opportunities in the area of particulate science and technology. Most importantly, AFM is emerging as a major analytical tool for the characterization of interfacial behavior by measuring interparticle and intermolecular forces for a wide range of particulate and fibrous materials that are often encountered in mineral processing, ceramic processing, colloid and polymer science, and in biological systems. In this paper, the principles and applications of the AFM in the area of particulate processing are illustrated. Results from interparticle force measurements involved in selected systems are presented. Also, the application of AFM for the determination of the point of zero charge and for the characterization of polymer surfaces is discussed.