Observation of lattice fringes of the Si(111)-7×7 structure by reflection electron microscopy*
1986; Wiley; Volume: 142; Issue: 2 Linguagem: Inglês
10.1111/j.1365-2818.1986.tb02758.x
ISSN1365-2818
AutoresY. Tanishiro, K. Takayanagi, K. Yagi,
Tópico(s)Force Microscopy Techniques and Applications
ResumoSUMMARY Lattice fringes of Si(111)–7×7 reconstructed surface structure in reflection electron microscopy (REM) are observed for the first time, and their characteristic features are presented. Due to a glancing reflection condition in REM, the fringes with a spacing of 2.3 nm of the 7×7 surface structure lattice are seen in a region of a certain defocus range (about 6–8 μm) in a foreshortened image. The glancing reflection geometry also results in a complicated dependence of fringe directions on imaging conditions (beam alignment, crystal orientation). A shift of the fringes across the surface atomic steps and out of phase boundaries is observed.
Referência(s)