Impurity screening in amorphous semiconductors
1971; Elsevier BV; Volume: 35; Issue: 2 Linguagem: Inglês
10.1016/0375-9601(71)90571-8
ISSN1873-2429
AutoresWerner Brandt, Julian Reinheimer,
Tópico(s)Thin-Film Transistor Technologies
ResumoThe dielectric response of semiconductors to the field spanned up by impurity atoms is shown to harden in the transformation from crystalline to amorphous forms in the sense that ceteris paribus the damping of umklapp processes reduced screening.
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