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FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

2014; Oxford University Press; Volume: 20; Issue: S3 Linguagem: Inglês

10.1017/s1431927614006679

1435-8115

Jaroslav Jiruše, Martin Haničinec, Miloslav Havelka, O. Hollricher, Wolfram Ibach, Peter Spizig,

Electron and X-Ray Spectroscopy Techniques

Journal Article FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy Get access Jaroslav Jiruse, Jaroslav Jiruse TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Martin Hanicinec, Martin Hanicinec TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Miloslav Havelka, Miloslav Havelka TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Olaf Hollricher, Olaf Hollricher WITec GmbH, Lise-Meitner-Strasse 6, Ulm, Germany Search for other works by this author on: Oxford Academic Google Scholar Wolfram Ibach, Wolfram Ibach WITec GmbH, Lise-Meitner-Strasse 6, Ulm, Germany Search for other works by this author on: Oxford Academic Google Scholar Peter Spizig Peter Spizig WITec GmbH, Lise-Meitner-Strasse 6, Ulm, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pages 990–991, https://doi.org/10.1017/S1431927614006679 Published: 27 August 2014