Investigation of TiO2SiO2 glasses by X-ray absorption spectroscopy
1983; Elsevier BV; Volume: 55; Issue: 1 Linguagem: Inglês
10.1016/0022-3093(83)90005-4
ISSN1873-4812
AutoresR.B. Greegor, Farrel W. Lytle, D. R. Sandstrom, Joe Wong, Peter C. Schultz,
Tópico(s)X-ray Spectroscopy and Fluorescence Analysis
ResumoThe coordination and nearest-neighbor bond distances of Ti in a series of TiO2SiO2 glasses have been quantitatively determined using a combination of XANES and EXAFS measurements about the Ti K-edge at 4966 eV. The glasses covering the range 0.012 to 14.7 wt% TiO2 were prepared by flame hydrolysis of predetermined mixtures of SiCl4 and TiCl4 vapors. At TiO2 concentrations below ∼0.05 wt%, Ti is found in a rutile-like octahedral coordination. With increased TiO2 content in the glass, a two-site model applies, in which Ti is found predominately in a fourfold site. About ∼9 wt% TiO2, t6he sixfold/fourfold ratio increases appreciably and eventually at ∼15 wt% TiO2, crystalline TiO2 segregates out as a second phase. The average TiOSi bond angle in these glasses was estimated to be ∼159 ° which is slightly larger than the most probable value of 152 degrees for SiOSi in vitreous SiO2. Within the accuracy of the edge shift measurements all Ti in the glass is in 4+ valence. Finally, various physical properties such as density, optical transparency and thermal expansion are correlated in light of the new structural data for this interesting binary silicate glass system.
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