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Processing of signals recorded by everhart‐thornley detectors based on quantitative analysis of information in scanning electron microscopes

1990; Wiley; Volume: 12; Issue: 2 Linguagem: Inglês

10.1002/sca.4950120207

1932-8745

A. Ya. Grigoryev,

Machine Learning in Materials Science

ScanningVolume 12, Issue 2 p. 87-91 Original PaperFree to Read Processing of signals recorded by everhart-thornley detectors based on quantitative analysis of information in scanning electron microscopes A. Ya. Grigoryev, Corresponding Author A. Ya. Grigoryev Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, Gomel, Union of Soviet Socialist RepublicsInstitute of Mechanics of Metal-Polymer Systems BSSR Academy of Sciences 32A Kirov Street Gomel 246652, USSRSearch for more papers by this author A. Ya. Grigoryev, Corresponding Author A. Ya. Grigoryev Institute of Mechanics of Metal-Polymer Systems of the BSSR Academy of Sciences, Gomel, Union of Soviet Socialist RepublicsInstitute of Mechanics of Metal-Polymer Systems BSSR Academy of Sciences 32A Kirov Street Gomel 246652, USSRSearch for more papers by this author First published: 1990 https://doi.org/10.1002/sca.4950120207Citations: 1AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References Goldstein GI, Newbury DI, Echlin P et al: Scanning Electron Microscopy and X-Ray Microanalysis. Plenum Press, New York and London (1981) 10.1007/978-1-4613-3273-2 Google Scholar Grigoryev AYa, Myshkin NK, Semenyuk NF, Kholodilov OV: Evaluation of specific surface areas by secondary-emission method. Sov Friction Wear 5, 793–798 (1988) Google Scholar Kholodilov OV, Grigoryev AYa, Myshkin NK: Reconstruction of true topographies of solid surfaces in scanning electron microscopes using secondary electrons. S canning 9, 156–161 (1987) 10.1002/sca.4950090404 Web of Science®Google Scholar Lange M, Reimer L, Tollkamp C: Testing of detector strategies in SEM by isodensities. J Microsc 134, 1–12 (1984) 10.1111/j.1365-2818.1984.tb00499.x Web of Science®Google Scholar Lukyanov CYu, Bernatovich VN: Dependence of secondary electron emission on incidence angle of primary electrons. Sov J Exper Theoret Phys 7, 856–866 (1937) CASGoogle Scholar Myshkin NK, Grigoryev AYa, Kholodilov OV: Quantitative evaluation of roughness by SEM. V Int Congr on Tribology EUROTRIB 89, Helsinki, Finland (1989) Google Scholar Müller HO: Die Abhängigkeit der SE einiger Metalle vom Einfallswinkel des primären Kathodenstrahls. Z Phys 104, 475–486 (1937) 10.1007/BF01330064 CASGoogle Scholar Reimer L, Volbert B: Detector system for backscattered electrons by conversion to secondary electrons. Scanning 2, 238–247 (1979) 10.1002/sca.4950020406 CASGoogle Scholar Tikhonov AN: On non-correct problems in linear algebra and stable method of their solution. DAN USSR 3, 591–594 (1965) Google Scholar Wurster R: Image analysis as a tool for quantitative interpretation of scanning electron micrographs. II Int Congr on X-ray Optics and Microanalysis. London, Canada (1987) 437–441 Google Scholar Citing Literature Volume12, Issue21990Pages 87-91 ReferencesRelatedInformation