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X-Ray Bragg Reflection and Infrared Absorption Topography of Ferroelectric NaNO 2

1981; Physical Society of Japan; Volume: 50; Issue: 2 Linguagem: Inglês

10.1143/jpsj.50.555

1347-4073

Shigeo Suzuki, Hidemi Murakami, Mieko Takagi,

Optical Polarization and Ellipsometry

X-ray diffraction topographic study of the partly electroded plates of ferroelectric NaNO 2 crystals (S. Suzuki and M. Takagi: J. Phys. Soc. Jpn 32 (1972) 1302) has revealed many small regions where the half way state of the rotational motion of NO 2 radicals at the time of the polarization reversal had been quenched. By making use of the sensitive dependence of infrared v 2 absorption on the orientation of the NO 2 radicals, rotation angle of NO 2 at the regions was estimated through the topographic (point by point) measurements of the infrared absorption. Topographic coincidence between X-ray topographs and infrared absorption was confirmed. Present study is the first work which had detected orientational change of molecules in a single crystal by using infrared absorption measurements in cooperation with X-ray topography.