Device simultaneous determination of the source and cavity parameters of a microcavity light-emitting diode
1999; American Institute of Physics; Volume: 85; Issue: 5 Linguagem: Inglês
10.1063/1.369617
ISSN1520-8850
AutoresD. Ochoa, R. Houdré, R. P. Stanley, C. Dill, U. Oesterlé, M. Ilegems,
Tópico(s)Strong Light-Matter Interactions
ResumoDetuning between the emission line and the Fabry-Pérot wavelength is a critical parameter for microcavity light-emitting diode (MCLED) design with regard to the efficiency and emission directionality. We present here a method to measure simultaneously the detuning and the linewidth of the source emitter on the device itself. This method uses numerical simulations and a fitting procedure with the angular emission pattern measured on the MCLED. It is accurate, nondestructive and easy to implement.
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