An oscillation type magnetometer

1951; IOP Publishing; Volume: 28; Issue: 2 Linguagem: Inglês

10.1088/0950-7671/28/2/309

ISSN

1747-387X

Autores

J. H. E. Griffiths, J. Ross Macdonald,

Tópico(s)

Magnetic properties of thin films

Resumo

A simple method of measuring the saturation magnetization of thin plane samples of ferromagnetic materials is described. In this method the sample performs oscillations in a uniform magnetic field about an axis which lies in the plane of the sample and is at right angles to the magnetic field. The method was tested by measurements on sheet nickel and Supermalloy 0.11 mm thick and has been used with films of nickel down to 0.1 μ thick.

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