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5.2: New Technique of Measuring of the Jones Matrix for a Polarization Medium at Oblique Light Incidence

2005; Wiley; Volume: 36; Issue: 1 Linguagem: Inglês

10.1889/1.2036486

2168-0159

Yukito Saitoh, Hiroyuki Mori, Jun‐ichi Hirakata, Keiji Mihayashi,

Photonic Crystals and Applications

SID Symposium Digest of Technical PapersVolume 36, Issue 1 p. 50-53 5.2: New Technique of Measuring of the Jones Matrix for a Polarization Medium at Oblique Light Incidence Yukito Saitoh, Yukito Saitoh Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this authorHiroyuki Mori, Hiroyuki Mori Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this authorJunichi Hirakata, Junichi Hirakata Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this authorKeiji Mihayashi, Keiji Mihayashi Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this author Yukito Saitoh, Yukito Saitoh Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this authorHiroyuki Mori, Hiroyuki Mori Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this authorJunichi Hirakata, Junichi Hirakata Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this authorKeiji Mihayashi, Keiji Mihayashi Flat Panel Display Materials Research Laboratories, Fuji Photo Film Co., Ltd. 210, Nakanuma, Minamiashigara-shi, Kanagawa, 250-0193, JAPANSearch for more papers by this author First published: 05 July 2012 https://doi.org/10.1889/1.2036486Citations: 2AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstract We propose a new technique of measuring the Jones matrix for a polarization medium (ex. optical compensation film) based on ellipsometry experimental methodology at oblique light incidence. Unlike uniaxial, biaxial, and N-stacked birefringent layer models, this technique describes the medium's polarization properties directly without any assumptions about the internal microscopic physical parameters. The obtained Jones matrix gives an accurate prediction of viewing angle properties of the liquid crystal displays. References H. Mori, M. Nagai, H. Nakayama, Y. Itoh, K. Kamada, K. Arakawa and K. Kawata: SID Symposium Digest 34 p., 1058 (2003). 10.1889/1.1832470 CASGoogle Scholar H. Mori and P. J. Bos: SID Symposium Digest 29 p., 830 (1998). 10.1889/1.1833892 Google Scholar K. Ohmuro, S. Kataoka, T. Sasaki and Y. Koike: SID Symposium Digest 28 p. 845 (1997). Google Scholar J. Chen, K. H. Kim, J. J. Jyu, J. H. Souk, J. R. Kelly and P. J. Bos: SID Symposium Digest 29 p. 315 (1998). 10.1889/1.1833756 Web of Science®Google Scholar Y. Saitoh, S. Kimura, K. Kusafuka and H. Shimizu: SID Symposium Digest 29 p., 706 (1998). 10.1889/1.1833858 Google Scholar T. Ishinabe, T. Miyashita and T. Uchida: Jpn. J. Appl. Phys. 41 4553 (2002). 10.1143/JJAP.41.4553 CASWeb of Science®Google Scholar T. Miyashita, C.-L. Kuo, M. Suzuki and T. Uchida: SID Symposium Digest 26 p. 797 (1995). Google Scholar Y. Fujimura, T. Nagatsuka, H. Yoshimi and T. Shimomura: SID Symposium Digest 22 p., 739 (1991). Google Scholar T. Higano, T. Ishinabe and T. Uchida: Proc. IDW'04 (2004) p. 59. Google Scholar Y. Takahashi, H. Watanabe, T. Kato: Proc. IDW'04 (2004) p.651. Google Scholar I. Moreno, P. Velásquez, C. R. Fernández-Pausa, M. M. Sanchez-López and F. Mateos: J. Appl. Phys. 94 3697 (2003). 10.1063/1.1601688 CASWeb of Science®Google Scholar P. Yeh: J. Opt. Soc. Am. A. 10 966 (1993). 10.1364/JOSAA.10.000966 Web of Science®Google Scholar F. H. Yu and H. S. Kwok: J. Opt. Soc. Am. A. 16 p. 2772 (1999). 10.1364/JOSAA.16.002772 Web of Science®Google Scholar C. R. Fernández-Pausa, I. Moreno, N. Bennis and C. Gómez-Reino: J. Opt. Soc. Am. A. 11 2074 (2000). 10.1364/JOSAA.17.002074 Web of Science®Google Scholar Citing Literature Volume36, Issue1May 2005Pages 50-53 ReferencesRelatedInformation