Phase diagram and oxygen stoichiometry of Y-Ba-Cu-O thin films
1988; American Institute of Physics; Volume: 53; Issue: 9 Linguagem: Inglês
10.1063/1.100149
ISSN1520-8842
AutoresK.-Y. Yang, H. Homma, R. Lee, R. Bhadra, M. Grimsditch, S. D. Bader, Jean‐Pierre Locquet, Y. Bruynseraede, Iván K. Schuller,
Tópico(s)Theoretical and Computational Physics
ResumoWe have performed an exhaustive study of the phase diagram of Y-Ba-Cu-O thin films using chemical analysis, energy dispersive x-ray spectroscopy, Auger electron spectroscopy, and x-ray diffraction. We show that Raman scattering can provide information regarding impurity phases and oxygen stoichiometry in thin films
Referência(s)