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Scanning tunneling microscopy of the surface topography and surface etching of nanoscale structures on the high-temperature superconductors

1991; American Institute of Physics; Volume: 70; Issue: 5 Linguagem: Inglês

10.1063/1.350351

1520-8850

Mark A. Harmer, C. R. Fincher, B. A. Parkinson,

Surface and Thin Film Phenomena

We report on the use of the scanning tunneling microscope (STM) for etching both single crystal and thin film, YBa2Cu3O7−x. Nanoscale features can be generated with the STM by ablation of atoms rastered by the microscope tip. The etching process can be controlled to remove layers of material which are multiples of the c axis (12 Å). Various geometric features have been fabricated ranging from fine lines to square etch pits. The STM has also been used to study the growth mechanism and surface topography of thin films of YBa2Cu3O7−x produced by in situ laser deposition (Jc typically 1×106 A cm−2 at 77 K). Step features equal to the c axis of the material can be readily identified which form pinnacles or chip like morphologies at the surface. These surfaces can also be etched with the STM to reveal a more continuous substructure consistent with the high Jc’s observed.