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Transmission Electron Diffraction of Alnico V

1960; American Institute of Physics; Volume: 31; Issue: 5 Linguagem: Inglês

10.1063/1.1984612

1520-8850

K. J. Kronenberg,

Advancements in Photolithography Techniques

By grinding, polishing, and etching it is possible to render Alnico V thin enough for transmission electron metallography. 80-kv electrons penetrated Alnico V metal confirming the two-phase structure found earlier with replica techniques. Transmission diffraction on Alnico V samples reveal the crystal structures of both phases. The development of one phase out of the other was studied on samples from Alnico V at various states of the usual heat treatment.