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Artigo Revisado por pares
BIBTEX RIS

Composition, chemical structure, and electronic band structure of rare earth oxide/Si(1 0 0) interfacial transition layer

2004; Elsevier BV; Volume: 72; Issue: 1-4 Linguagem: Inglês

10.1016/j.mee.2004.01.005

ISSN

1873-5568

Autores

Takanori Hattori, T. Yoshida, Tomohiro Shiraishi, Kazutoshi Takahashi, Hiroshi Nohira, S. Joumori, K. Nakajima, Motofumi Suzuki, Kenji Kimura, I. Kashiwagi, C. Ohshima, Shun-ichiro Ohmi, Hiroshi Iwai,

Tópico(s)

Electron and X-Ray Spectroscopy Techniques

Referência(s)
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Microelectronic Engineering
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