Portal de Periódicos da CAPES

Porous Silicon Thermal Conductivity by Scanning Probe Microscopy

2000; Wiley; Volume: 182; Issue: 2 Linguagem: Inglês

10.1002/1521-396x(200012)182

1521-396X

Vladimir Lysenko, Sébastian Volz,

Near-Field Optical Microscopy

physica status solidi (a)Volume 182, Issue 2 p. R6-R7 Rapid Research Note Porous Silicon Thermal Conductivity by Scanning Probe Microscopy V. Lysenko, V. Lysenko Laboratoire de Physique de la Matière CNRS-UMR 5511, INSA de Lyon, 20 av. Albert Einstein, Bat. 502, F-69621 Villeurbanne Cedex, FranceSearch for more papers by this authorS. Volz, S. Volz Laboratoire d'Etudes Thermiques, CNRS-UMR 6608, Ecole Nationale Supérieure de Mécanique et d'Aérotechnique, BP 109, F-86960 Futuroscope Cedex, FranceSearch for more papers by this author V. Lysenko, V. Lysenko Laboratoire de Physique de la Matière CNRS-UMR 5511, INSA de Lyon, 20 av. Albert Einstein, Bat. 502, F-69621 Villeurbanne Cedex, FranceSearch for more papers by this authorS. Volz, S. Volz Laboratoire d'Etudes Thermiques, CNRS-UMR 6608, Ecole Nationale Supérieure de Mécanique et d'Aérotechnique, BP 109, F-86960 Futuroscope Cedex, FranceSearch for more papers by this author First published: 21 December 2000 https://doi.org/10.1002/1521-396X(200012)182:2 3.0.CO;2-XCitations: 7AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article.Citing Literature Volume182, Issue2December 2000Pages R6-R7 RelatedInformation