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Raman scattering study of interlayer bonding in CdI2 AND SnS2 under hydrostatic pressure: analysis by use of Van Der Waals interaction

1983; Elsevier BV; Volume: 44; Issue: 11 Linguagem: Inglês

10.1016/0022-3697(83)90091-4

1879-2553

Hisashi Katahama, Satοru Nakashima, Akiyoshi Mitsuishi, M. Ishigame, H. Arashi,

Solid-state spectroscopy and crystallography

The pressure dependence of inter- and intra-layer modes in 4H-CdI2, 4HSnS2 and 18R-SnS2 has been studied using Raman scattering techniques. X-ray diffraction measurements on 4H-CdI2 give the variation of lattice parameters under hydrostatic pressure. The relationship between interlayer bond-length and bond-strength is obtained from a combination of the Raman scattering and X-ray diffraction results. The results are analyzed by use of a short range 6-exp type potential. Van der Waals constants for the anion-anion interaction and polarizabilities of the anion in CdI2 and SnS2 are determined from fitting the calculation to the experimental results.