A high resolution probe for scanning electrostatic potential profiles across surfaces

1973; IOP Publishing; Volume: 6; Issue: 5 Linguagem: Inglês

10.1088/0022-3735/6/5/019

ISSN

2051-5685

Autores

B Scruton, B H Blott,

Tópico(s)

Surface and Thin Film Phenomena

Resumo

An electrostatic probe with spatial resolution of 50 mu m has been developed to study the potential variation along a surface. A turntable arrangement enables surfaces to be scanned at rates of 1.8-16 m s-1; the probe yields a precision of 20 mV for a single pass. Calibration of the instrument using a test grating is described. A study of clean metal surfaces contaminated by fingerprints has shown surface potential variations as large as 400 mV.

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