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Measurement techniques in MIM device characterization

1990; Taylor & Francis; Volume: 68; Issue: 3 Linguagem: Inglês

10.1080/00207219008921179

1362-3060

P. J. Dunne, R. A. Collins,

Thin-Film Transistor Technologies

A direct experimental comparison is made between current-voltage characteristics for electroformed MIM sandwich devices obtained using a 4-terminal measuring system and those obtained using a 2-terminal technique. The results indicate that 2-terminal results, which occur regularly in this field of study, cannot be safely used to make either qualitative or quantitative comparisons with theory. It is further suggested that edge thickening layers, commonly employed in these device structures to eliminate edge effects, can significantly affect the device characteristics.