Photoelectrons from negative dimers and clusters of sulfur dioxide
1991; Elsevier BV; Volume: 177; Issue: 4-5 Linguagem: Inglês
10.1016/0009-2614(91)85070-d
ISSN1873-4448
AutoresThomas Dresch, H. Krämer, Y. Thurner, R. Weber,
Tópico(s)Mass Spectrometry Techniques and Applications
ResumoAbstract Photoelectrons originating from sulfur dioxide cluster anions were studied using a tandem mass spectrometer combined with an electron detector and intracavity argon-ion and dye lasers. The absolute photodetachment cross section of the dimer anion increases to (8 ± 1) × 10 −19 cm 2 at 2.71 eV photon energy. Electrons detected from the interaction of photons with sulfur dioxide clusters were found to be produced in sequential two-step processes only, revealing a lower bound of the cluster's detachment threshold energy of 2.7 eV.
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