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Total reflection X-ray fluorescence analysis of low-Z elements

1989; Elsevier BV; Volume: 44; Issue: 5 Linguagem: Inglês

10.1016/0584-8547(89)80055-2

1873-3565

Christina Streli, H. Aiginoer, P. Wobrauschek,

Nuclear Physics and Applications

Photoninduced energy dispersive X-ray fluorescence analysis in total reflection geometry has been applied to low-Z elements. To avoid the absorption in the Be-window a windowless Si(Li)-detector has been used. Icing of the detector crystal is prevented by a thin C-foil. Physical reasons of the low energy background are reduced using a high energy cut-off reflector. Measurements of low-Z elements from O (Z = 8) onwards are possible and detection limits in the ng region are obtained.