High precision differential measurement of surface photovoltage transients on ultrathin CdS layers
2008; American Institute of Physics; Volume: 79; Issue: 11 Linguagem: Inglês
10.1063/1.3020757
ISSN1527-2400
AutoresTh. Dittrich, Sven P. Bönisch, P. Zabel, Sangeeta Dube,
Tópico(s)Nanowire Synthesis and Applications
ResumoTime-resolved surface photovoltage (SPV) is an important method for studying charge separation, for example, in nanostructured semiconductors. High precision differential measurement of SPV transients was realized with two identical measurement capacitors and high-impedance buffers. In addition, logarithmic readout and averaging procedures were implemented for single transients over eight magnitudes in time. As a model system ultrathin CdS layers were investigated. The thickness dependencies of the SPV amplitudes and that of the dominating relaxation mechanisms are demonstrated and discussed.
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