EELS study of radiation damage in chlorinated Cu-phthalocyanine and poly GeO-phthalocyanine
1992; Elsevier BV; Volume: 41; Issue: 1-3 Linguagem: Inglês
10.1016/0304-3991(92)90092-x
ISSN1879-2723
AutoresHiroki Kurata, S. Isoda, Takashi Kobayashi,
Tópico(s)Photocathodes and Microchannel Plates
ResumoElectron energy-loss near edge structure (ELNES) was measured with parallel-EELS in the carbon and the nitrogen K-edges of the chlorinated Cu-phthalocyanine and poly GeO-phthalocyanine as a function of irradiation dose. The intensity of the first ELNES peak, which was attributed to the 1s → π∗ transition peak in both edges, was decreased with an increase of irradiation dose. This fact clearly shows the unoccupied π∗ molecular orbitals were changed in the course of electron irradiation. This 1s → π∗ transition peak of the chlorinated Cu-Pc fades more slowly than that of the poly GeO-Pc, which can be understood by the “cage effect” of the atoms liberated from the molecules. Moreover, it was observed that the fading of the nitrogen 1s → π∗ transition peak was rapid in comparison with that of the carbon peak in the poly GeO-Pc film. This suggests that the radiation damage may be a site-dependent process in the poly GeO-Pc.
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