Portal de Periódicos da CAPES

Near-field scanning optical microscopy

1996; Elsevier BV; Volume: 1; Issue: 4 Linguagem: Inglês

10.1016/s1359-0286(96)80062-3

1879-0348

Steven K. Buratto,

Quantum Dots Synthesis And Properties

Near-field scanning optical microscopy (NSOM) is a new scanned probe microscopy technique capable of combining high spatial resolution (10–100 nm) and optical contrast. NSOM can be applied to a wide variety of materials, including semiconductors, molecular crystals, polymers and ceramics. The results are images of unprecedented detail which provide important new insights into the mesoscale physics of these materials.