Difference reflectance spectroscopy of anodic films on copper and copper base alloys
1991; Elsevier BV; Volume: 307; Issue: 1-2 Linguagem: Inglês
10.1016/0022-0728(91)85540-6
ISSN2590-2954
AutoresS.R. de Sánchez, L.E.A. Berlouis, David J. Schiffrin,
Tópico(s)Corrosion Behavior and Inhibition
ResumoAbstract The development of difference reflectance techniques using conventional spectrophotometers for the study of the growth and the characterisation of anodic films on copper and its alloys with nickel is described. It is shown that Cu 2 O is the main component of anodic films formed on 90 Cu + 10 Ni and 70 Cu + 30 Ni. CuO appears to be formed when O 2 is reduced on Cu 2 O covered electrodes.
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