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Artigo Revisado por pares
BIBTEX RIS

Electron tunneling across an interfacial water layer inside an STM junction: tunneling distance, barrier height and water polarization effect

1998; Springer Science+Business Media; Volume: 66; Issue: 7 Linguagem: Inglês

10.1007/s003390051184

ISSN

1432-0630

Autores

Jae Ryang Hahn, Yeong-Kyu Hong, Hyun Kang,

Tópico(s)

Electronic and Structural Properties of Oxides

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Applied Physics A
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