Carta Revisado por pares

Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self‐assembled monolayer surfaces

2001; Wiley; Volume: 15; Issue: 5 Linguagem: Inglês

10.1002/rcm.236

ISSN

1097-0231

Autores

Robert D. English, Michael J. Van Stipdonk, Christopher W. Diehnelt, E. A. Schweikert,

Tópico(s)

Advanced biosensing and bioanalysis techniques

Resumo

Rapid Communications in Mass SpectrometryVolume 15, Issue 5 p. 370-372 Letter to the Editor Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces Robert D. English, Robert D. English Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this authorMichael J. Van Stipdonk, Michael J. Van Stipdonk Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this authorChristopher W. Diehnelt, Christopher W. Diehnelt Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this authorEmile A. Schweikert, Corresponding Author Emile A. Schweikert schweikert@mail.chem.tamu.edu Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USACenter for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this author Robert D. English, Robert D. English Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this authorMichael J. Van Stipdonk, Michael J. Van Stipdonk Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this authorChristopher W. Diehnelt, Christopher W. Diehnelt Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this authorEmile A. Schweikert, Corresponding Author Emile A. Schweikert schweikert@mail.chem.tamu.edu Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USACenter for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USASearch for more papers by this author First published: 20 February 2001 https://doi.org/10.1002/rcm.236Citations: 4Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume15, Issue515 March 2001Pages 370-372 RelatedInformation

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