FIB Preparation and STEM Observation of Specified Area from Two Direction
2005; Oxford University Press; Volume: 11; Issue: S02 Linguagem: Inglês
10.1017/s1431927605508353
ISSN1435-8115
AutoresToshiko Kuba, Noriaki Endo, Eiji Okunishi, Takashi Suzuki,
Tópico(s)Advanced Surface Polishing Techniques
ResumoJournal Article FIB Preparation and STEM Observation of Specified Area from Two Direction Get access T Kuba, T Kuba JEOL Ltd. Search for other works by this author on: Oxford Academic Google Scholar N Endo, N Endo JEOL Ltd. Search for other works by this author on: Oxford Academic Google Scholar E Okunishi, E Okunishi JEOL Ltd. Search for other works by this author on: Oxford Academic Google Scholar T Suzuki T Suzuki JEOL Ltd. Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 11, Issue S02, 1 August 2005, Pages 852–853, https://doi.org/10.1017/S1431927605508353 Published: 01 August 2005
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