Surface EXAFS and XANES studies of S/Ni(111): A pseudo-c(2×2)S/Ni(100) model with surface reconstruction
1989; Elsevier BV; Volume: 214; Issue: 3 Linguagem: Inglês
10.1016/0039-6028(89)90173-8
ISSN1879-2758
AutoresYoshinori Kitajima, Toshihiko Yokoyama, T. Ohta, M. Funabashi, Nobuhiro Kosugi, Haruo Kuroda,
Tópico(s)Chalcogenide Semiconductor Thin Films
ResumoThe surface local structure of S/Ni(111) with a complicated (53×2) LEED pattern is studied by the S K-edge polarization-dependent surface EXAFS and XANES. It is revealed that the first nickel layer of the surface is reconstructed to a distorted-c(2×2)S/Ni(100) overlayer. The nearest neighbor SNi bond distance was found to be 2.22 ± 0.03 Å, which is the same value as that for c(2×2)S/Ni(100). This is the first application of surface EXAFS spectroscopy to a system with such a complicated LEED pattern.
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