Criterion of goodness of fit for deconvolution calculations
1981; American Institute of Physics; Volume: 52; Issue: 2 Linguagem: Inglês
10.1063/1.1136571
ISSN1527-2400
AutoresJ. A. Irvin, T. I. Quickenden, David F. Sangster,
Tópico(s)Calibration and Measurement Techniques
ResumoA quantitative statistical test for ascertaining the goodness of fit in deconvolution analysis is presented and is compared with two currently used tests. The new test is generally applicable and unlike the latter tests, still holds when significant random errors occur in both the measured excitation pulse and the measured luminescence curve. One of the existing tests involves a convenient, but subjective assessment of the randomness of a plot of weighted residuals and the new quantitative text is used to evaluate the scope of this subjective approach.
Referência(s)