Interface segregation in copolymer blends measured by neutron reflection and secondary ion mass spectrometry
1991; Elsevier BV; Volume: 173; Issue: 1-2 Linguagem: Inglês
10.1016/0921-4526(91)90050-o
ISSN1873-2135
AutoresT. Mansfield, Richard S. Stein, Russell J. Composto, Miriam Rafailovich, Konstantin Sokolov, S. A. Schwarz,
Tópico(s)Nanopore and Nanochannel Transport Studies
ResumoAbstract In polymer blends of poly(styrene-co-acrylonitrile) (SAN) differing in acrylonitrile content, the SAN with the lower acrylonitrile component enriches the vacuum-polymer and polymer-substrate interfaces. The concentration profiles determined by neutron reflection measurements yield an interfacial excess of 80 and 38 A near the surface and substrate, respectively. Using contrast matching, neutron reflection is shown to be quite sensitive to segregation near buried interfaces. Depths profiles measured by neutron reflection and secondary-ion mass spectrometry are in good qualitative agreement.
Referência(s)