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Exciton-L0 Phonon Scattering in Cu2O

1974; Physical Society of Japan; Volume: 36; Issue: 3 Linguagem: Inglês

10.1143/jpsj.36.753

1347-4073

Kōichi Shindō, Takenari Goto, Takuchi Anzai,

Semiconductor Quantum Structures and Devices

Reliable absorption line shape of the several higher members of the yellow exciton series in Cu 2 O has been measured by the photoelectric method using a monochromator with a large dispersion at 1.8 K, and has been analyzed on the basis of Toyozawa's formula. The origin of the half width is considered to come from the interband scattering of the exciton from the p state to the 1 s state by the two modes of L0 phonons. The estimated ratio in the line width of the n -th member to the second member of the exciton series is in agreement with the experimental one.