X-ray spectroscopic studies in glassy semiconducting Ge20Se80 and Ge20Se80-xInx alloys
1990; Elsevier BV; Volume: 162; Issue: 3 Linguagem: Inglês
10.1016/0921-4526(90)90011-i
ISSN1873-2135
AutoresArvind Kumar, M. Husain, Sanjay Swarup, A. N. Nigam, Anjani Kumar,
Tópico(s)X-ray Spectroscopy and Fluorescence Analysis
ResumoThe shift of the K-absorption edge (ΔEK) is measured in ternary alloys of Ge20Se80-xInx with respect to the binary Se80Ge20 alloy. The results indicate that the K-edge of Se progressively shifts towards the lower energy side as the concentration increases from 0 to 10 at%. However at a higher concentration of In (χ > 15), the negative shift starts decreasing. The results are in accordance with Pauling's concept of electronegativity and indicate that the nature of bonds is iono-covalent in character in these glasses, as found in many crystalline solids. The composition dependence of ΔEK is also discussed in terms of the structure of Ge-Se system.
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