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Test generation for combinational logic circuits using information theory

1986; Elsevier BV; Volume: 12; Issue: 1-2 Linguagem: Inglês

10.1016/0045-7906(86)90019-4

1879-0755

Paul D. Stigall, Y.M. Erten,

Radiation Effects in Electronics

Application of probability and information theory to test pattern generation for combinational logic circuits is investigated. It is verified that choosing the input probability to maximize the output information reduced to a minimum the number of random patterns to be generated to detect all the faults in the circuit. This result is tested on three examples using a logic simulator. The simulator was implemented using a TRS-80 Color Computer with 16K memory, and the use of microcomputers in fault detection is discussed. This work considers only combinational logic circuits and single stuck-at type faults.