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Electric‐Field Screening in Atomically Thin Layers of MoS 2 : the Role of Interlayer Coupling

2012; Volume: 25; Issue: 6 Linguagem: Inglês

10.1002/adma.201203731

1521-4095

Andrés Castellanos-Gómez, E. Cappelluti, Rafael Roldán, Nicolás Agraı̈t, F. Guinea, Gabino Rubio‐Bollinger,

Electronic and Structural Properties of Oxides

The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas–Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2.