Beam analysis system for Texas A&M K500 cyclotron
1995; Elsevier BV; Volume: 361; Issue: 1-2 Linguagem: Inglês
10.1016/0168-9002(95)00122-0
ISSN1872-9576
AutoresD. H. Youngblood, J. D. Bronson,
Tópico(s)Gyrotron and Vacuum Electronics Research
ResumoA beam analysis system has been designed to provide a dispersion of 19.3 cm per % ΔPP with an ultimate aberration limited resolution of ΔEE up to 12500 for the full emittance of beams from the Texas A&M K500 cyclotron. Both dispersion matched and slit limited solutions for beam delivered to the MDM spectrometer were obtained. A total of 175 degrees of bend, in opposite direction 88 and 87 degree segments, is used with an intermediate focus between the segments. The first half may be used as a lower resolution analysis system with the second half serving to remove slit scattered particles so that a very clean beam can be transported to the MDM spectrometer for zero degree inelastic scattering measurements. The system is designed to use seven small inexpensive n = 0 dipoles with eight quadrupoles to provide focusing. Techniques for tuning are developed and the stability of the solutions with small changes in focusing are explored.
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