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Atomic force microscopy of thin Ag films. Relationship between morphology and optical properties

1993; Elsevier BV; Volume: 212; Issue: 1-2 Linguagem: Inglês

10.1016/0009-2614(93)87106-d

1873-4448

S. Roark, Kathy L. Rowlen,

Surface and Thin Film Phenomena

Atomic force microscopy is used to quantify the surface morphology of thin Ag films. The three-dimensional nature of atomic force micrographs allows for previously unavailable direct measurement of mean particle height, radius, aspect ratio, and the distribution in these parameters. These measurements allow for comparison of surface morphology, optical properties and thin metal film optical theory.