Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO
2002; Optica Publishing Group; Volume: 27; Issue: 23 Linguagem: Inglês
10.1364/ol.27.002127
ISSN1539-4794
AutoresOliver D. Mücke, T. Tritschler, Martin Wegener, Uwe Morgner, Franz X. Kärtner,
Tópico(s)Photonic Crystal and Fiber Optics
ResumoWe excite ZnO samples with two-cycle optical pulses directly from a mode-locked oscillator with average powers of several tens of milliwatts. The emitted light reveals peaks at the carrier-envelope offset frequency f(ø) and at 2f(ø) in the radio-frequency spectra. These peaks can still be detected in layers as thin as 350 nm-a step toward determining the carrier-envelope offset phase itself.
Referência(s)