Molecular beam study of laser-induced chemical etching of Si(111) by chlorine molecules
1988; American Institute of Physics; Volume: 53; Issue: 20 Linguagem: Inglês
10.1063/1.100334
ISSN1520-8842
AutoresYulin Li, Zhuangjian Zhang, Qike Zheng, Jin Zhong-Kao, Zhenkai Wu, Qi‐Zong Qin,
Tópico(s)Laser-induced spectroscopy and plasma
ResumoChemical etching of Si(111) surface by chlorine molecules under 355 and 560 nm irradiation has been studied using a continuous wave supersonic molecular beam. Only two products, SiCl and SiCl2, were observed. The translational energy distributions of the gaseous products have been measured as a function of laser fluence, and can be fitted with Maxwell–Boltzmann distributions. Study on the effect of translational energy of incident chlorine molecules on the reaction rate is also presented for the first time.
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