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Three-dimensional imaging when using a pseudodeep hologram and extended reference source

1994; SPIE; Volume: 2043; Linguagem: Inglês

10.1117/12.165548

1996-756X

Yuri N. Denisyuk, N. M. Ganzherli,

Photorefractive and Nonlinear Optics

The analysis of selectogram characteristics is carried out. The term selectogram stands for the structure obtained by recording the interference pattern of the radiation of an object and that of an extended reference source of light on an inclined photographic plate. The current presentation describes a case for which the image of the object being recorded is focused near the surface of the selectogram. It is shown that in this case the angular size of an element determining the resolving power of the image reconstructed by the selectogram is approximately equal to the angular width of a horizontal slit which filters the radiation of the object. The general structure of the radiation reconstructed by the selectogram is also considered.